A Designer's Guide To Built-In Self-Test
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| Originally published | May 31, 2002 |
| Authors | Charles E. Stroud |
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| ID | 1901362 |
About A Designer's Guide To Built-In Self-Test
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. . . .