Built-in Test For VLSI
| Use attributes for filter ! | |
| Google books | books.google.com |
|---|---|
| Originally published | October 20, 1987 |
| Authors | Paul H. Bardell |
| Date of Reg. | |
| Date of Upd. | |
| ID | 1854725 |
About Built-in Test For VLSI
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. . . .