Ellipsometry And Polarized Light
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| Google books | books.google.com |
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| Originally published | 1977 |
| Authors | R. M. A. Azzam |
| Date of Reg. | |
| Date of Upd. | |
| ID | 2010047 |
About Ellipsometry And Polarized Light
Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. . . .