Infrared Ellipsometry On Semiconductor Layer Structures
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| Originally published | November 26, 2004 |
| Authors | Mathias Schubert |
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| ID | 2130671 |
About Infrared Ellipsometry On Semiconductor Layer Structures
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. . . .