Reliability Of MEMS: Testing Of Materials And Devices
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| Google books | books.google.com |
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| Originally published | February 4, 2008 |
| Editors | Oliver Brand |
| Osamu Tabata | |
| Toshiyuki Tsuchiya | |
| Gary K. Fedder | |
| Jan G. Korvink | |
| Date of Reg. | |
| Date of Upd. | |
| ID | 2221381 |
About Reliability Of MEMS: Testing Of Materials And Devices
This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. . . .