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VLSI Testing

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Originally published 1998
AuthorsStanley L. Hurst
Date of Reg.
Date of Upd.
ID2126385
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About VLSI Testing


This book is a self-contained introduction to all aspects of microelectronic (IC) testing. It includes the theory necessary for advanced students as well as reference to industrial practice and economics that will interest designers in industry. . . .

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